NEU-Defect-Classification

the experimental study has purpose to detect defects in products or components during production

Name		Name	Last commit message	Last commit date
Latest commit History 3 Commits
IMAGES.7z		IMAGES.7z
NEU Data Exploration.ipynb		NEU Data Exploration.ipynb
NEU Image Classification.ipynb		NEU Image Classification.ipynb
NEU Surface Defect Database_first.ipynb		NEU Surface Defect Database_first.ipynb
NEU_Multiple ANN Comparations Models.ipynb		NEU_Multiple ANN Comparations Models.ipynb
README.md		README.md

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